IR-MW DOUBLE RESONANCE SPECTROSCOPY OF THE $SiF_{4} \upsilon_{3}$ FUNDAMENTAL USING A TUNABLE DIODE LASER

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1982

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Ohio State University

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Pure rotational transitions among the tetrahedral fine structure splittings of SiF4υ3 state were investigated by infrared-radiofrequency double resonance. A laser diode provided by Fujitsu Ltd. was used as an infrared pumping radiation source. About 100 transitions were measured with the accuracy of a few tens of kHz in the frequency range of 1 to 500 MHz. Tensor constants of the excited state were determined accurately. This work was supported by Joint Research Program of Institute for Molecular Science in 1981-1982.

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http://hdl.handle.net/1811/29109

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Abstracts of OSU International Symposium on Molecular Spectroscopy 1980-1989