Effects of Probe Moment on MFM Imaging of Nanomaterials
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Date
2025-05
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The Ohio State University
Abstract
Magnetic Force Microscopy (MFM) is a robust characterization tool for visualizing and quantifying magnetic interactions at the nanoscale. By employing magnetically coated probes that interact with localized stray fields above a sample surface, MFM provides both topographical and magnetic phase information with high spatial resolution. In this study, MFM is applied to investigate and compare the magnetic behavior of superparamagnetic and ferromagnetic nanomaterials, with a particular emphasis on the influence of probe magnetic moment strength. Superparamagnetic iron oxide nanoparticle (SPION) aggregates are used as the representative superparamagnetic sample, while an iron thin film serves as the ferromagnetic counterpart. This thesis aims to assess how different MFM probe strengths affect the visualization and interpretation of these two material systems, considering the trade-offs between spatial resolution and signal sensitivity. Our results demonstrate that for ferromagnetic samples, high moment probes yield better spatial resolution and sensitivity, with clear signal detection even at extended lift heights. In contrast, both low moment and high moment probes provided comparable spatial resolution for SPION patterns, though high moment probes offered higher signal-to-noise ratios. These results underscore the critical role of probe selection in optimizing MFM performance based on the magnetic nature of the sample.
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Keywords
Magnetic Force Microscopy (MFM), Probe Magnetic Moment, Superparamagnetic Iron Oxide Nanoparticles, Nanomaterials, Ferromagnetism, Superparamagnetism