A NEW METHOD FOR THE DIRECT MEASUREMENT OF SPECTRAL LINE WIDTHS AND STRENGTHS.

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1967

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Ohio State University

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It is well known that spectral line strengths and widths may be determined from observed lines by the use of correction curves obtained by numerically passing a spectrometer slit function over a spectral line of known shape (e.g., a Cauchy function for a Lorentz line1 ). One such curve is a plot of γ0(4a)γ0(2a) vs 2aγr where is the half width at half height of the spectrometer slit function, γr is the true line half width at half height and γ0(4a) is the half width at half height of the absorption coefficient measured directly from a spectrometer having a spectral resolution of 4a. Once γ0(4a)γ0(2a) has been determined from two measurements on a given line, the ratio 2aγr is thus determined, and γr and the line strength S may be determined from other correction curves. A new procedure has been developed which makes use of the fact that the γ0(4a)γ0(2a) vs 2aγr curve is quite insensitive to the location of the line of 100% transmittance as long as the measurement extends into the wings of the line a distance at which instrumental distortion of the line is small. This is the case, typically, for measurements carried out a distance of 6 or 7 half widths from the line center for a ratio 2aγr∼1. Families of correction curves have been constructed, each member of which corresponds to the distance into the wings a measurement has been taken. The line widths of the first overtone band of the hydrogen fluoride molecule have been measured at pressures of 1/4, 1/2, and 1 atmosphere using this procedure. The accuracy of this correction method has also led to a slight revision of the line strengths reported previously2, and to a slightly different value of the dipole moment expansion coefficient M2.

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This work was supported by the Advanced Research Projects Agency, under Contract DAHC15 67 C 0062, as a part of Project DEFENDER. 1 H.J. Kostkowski and A. M. Bass, J. Opt. Soc. Amer. 46, 1060, (1956). 2 R. E. Meredith, Bull. Amer. Phys. Soc. January, 1966


Author Institution: Infrared Physics Laboratory, Willow Run Laboratories The University of Michigan

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