Characterization of AA2024-T3 by Scanning Kelvin Probe Force Microscopy
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Citation:Schmutz, P.; Frankel, G. S. "Characterization of AA2024-T3 by Scanning Kelvin Probe Force Microscopy," Journal of the Electrochemical Society, v. 145, no. 7, 1998, pp. 2285-2295.
Volta potential mapping of AA2024-T3 on surfaces was performed with an atomic force microscope. A linear relation was found between the Volta potential measured in air and the corrosion potential in aqueous solution for a range of pure metal samples, indicating that this potential is a measurement of the practical nobility of the surface. Large differences in the Volta potential of intermetallic particles in AA2024-T3 and the matrix phase resulted in a potential map with high contrast that clearly identifies the location of the particles. All intermetallic particles, including the Mg-containing S-phase particles, had a Volta potential noble to that of the matrix. Surface films on the particles and the matrix were found to have strong effects on the potential, and probably explain the noble nature of the Mg-containing particles, which have been reported to be active to the matrix in solution. The effect of these surface films was examined by refreshing the sample surface using different techniques. Lateral heterogeneities in certain intermetallic particles were also revealed.
This work was supported by the Air Force Office of Scientific Research under contract no. F49620-96-1-0479, Major H. De Long, Administrator. P. S. was partially supported by the Swiss National Foundation for Research.