Davenport, A. J.; Isaacs, H. S.; Frankel, G. S.; Schrott, A. G.; Jahnes, C. V.; Russak, M. A. "In Situ X-Ray Absorption Study of Chromium Valency Changes in Passive Oxides on Sputtered AlCr Thin Films under Electrochemical Control," Journal of the Electrochemical Society, v. 138, no. 1, 1991, pp. 337-338.
This work was carried out in part under the auspices of the US Department of Energy, Division of Materials Sciences, Office of Basic Energy Science under Contract No. DE-AC02-76CH00016. XANES measurements were carried out at the National Synchrotron Light Source Beamline X19A.