dc.creator Strow, L. en_US dc.date.accessioned 2007-08-31T14:12:28Z dc.date.available 2007-08-31T14:12:28Z dc.date.issued 1982 en_US dc.identifier 1982-RA-11 en_US dc.identifier.uri http://hdl.handle.net/1811/29194 dc.description 1. M.T. Emerson and D.F. Eggers, J. Chem. Phys, 37, 251 (1962). en_US dc.description.abstract The $\nu_{2}$ band of $H_{2}S$ exhibits remarkably large intensity perturbations due to centrifugal distortion. A previous low resolution study of this $band^{1}$ found that the P branch is about 1/5 as intense as the R branch. In this work, the strengths of 94 lines in the $\nu_{2}$ band have been measured to an average accuracy of 3% using a tunable diode laser. Since the observed low pressure line widths are on the average only 1.3% larger than the calculated Poppler widths, the line profile distortion is small, and thus the strengths could be determined using the line center absorption with slight corrections to account for residual line broadening by the laser bandwidth and gas pressure. The maximum values of J, $K_{a}$, and $K_{e}$ observed are 12, 7, and 10 respectively. The measured line strengths range from 5 times larger to 17 times smaller than strengths calculated using a Watson-type Hamiltonian with an untransformed dipole moment operator. en_US dc.format.extent 75165 bytes dc.format.mimetype image/jpeg dc.language.iso English en_US dc.publisher Ohio State University en_US dc.title DIODE LASER MEASUREMENTS OF LINE STRENGTHS IN THE $\nu^{2}$ BAND OF $H_{2}S$ en_US dc.type article en_US
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