DIODE LASER MEASUREMENTS OF STRENGTHS AND WIDTHS FOR SPECTRAL LINES IN THE $\upsilon_{3}$ AND $\upsilon_{2} + \upsilon_{4}$ BANDS OF $^{12}CH_{4}$ AND $^{13}CH_{4}$

dc.creator	Devi, V. Malathy	en_US
dc.creator	Fridovich, B.	en_US
dc.creator	Snyder, D. G. S.	en_US
dc.creator	Jones, G. D.	en_US
dc.date.accessioned	2007-08-31T14:10:10Z
dc.date.available	2007-08-31T14:10:10Z
dc.date.issued	1982	en_US
dc.identifier	1982-FA-10	en_US
dc.identifier.uri	http://hdl.handle.net/1811/29107
dc.description.abstract	Line strengths, and self- and nitrogen-broadened half-widths have been measured for spectral lines in the $\upsilon_{3}$ and $\upsilon_{2} + \upsilon_{4}$ bands of $^{12}CH_{4}$ and $^{13}CH_{4}$ in the interval $2873-2883 cm^{-1}$. A carbon-13 enriched sample was used for the $^{13}CH_{4}$ measurements. The temperature dependence of the Lorentz broadening coefficient for nitrogen broadening has also been determined for some of the transitions.	en_US
dc.format.extent	43230 bytes
dc.format.mimetype	image/jpeg
dc.language.iso	English	en_US
dc.publisher	Ohio State University	en_US
dc.title	DIODE LASER MEASUREMENTS OF STRENGTHS AND WIDTHS FOR SPECTRAL LINES IN THE $\upsilon_{3}$ AND $\upsilon_{2} + \upsilon_{4}$ BANDS OF $^{12}CH_{4}$ AND $^{13}CH_{4}$	en_US
dc.type	article	en_US