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dc.creatorRoger, J. P.en_US
dc.creatorFournier, D.en_US
dc.creatorBoccara, A. C.en_US
dc.date.accessioned2007-08-31T14:09:44Z
dc.date.available2007-08-31T14:09:44Z
dc.date.issued1982en_US
dc.identifier1982-TG'-7en_US
dc.identifier.urihttp://hdl.handle.net/1811/29091
dc.description$^{1}$ A.C. Boccara, D, Fournier, and J. Badoz, Appl. Phys. Lett. 36 (2), 130,1980. $^{2}$D. Fournier, A.C. Boccara, and J. Badoz, Appl. Opt. 21 (1), 74, 1982.en_US
dc.description.abstractWe have recently introduced a new photothermal technique based on the well-known $""mirage effect""^{1}$. Used at a solid-liquid interface, this method was found to be two orders of magnitude more sensitive than conventional photoacoustic $spectroscopy^{2}$. The application of this method both to metal-electrolyte and semiconductor-electrolyte interfaces will be illustrated. By replacing the intensity modulation by a polarization modulation of the light, we have just improved the performance of our instrument significantly. For example, we have been able to work on electrochemical deposition corresponding to one tenth of a monolayer of Cu on an unprepared Pt electrode.en_US
dc.format.extent74736 bytes
dc.format.mimetypeimage/jpeg
dc.language.isoEnglishen_US
dc.publisherOhio State Universityen_US
dc.titleHIGHLY SENSITIVE PHOTOTHERMAL DEFLECTION SPECTROSCOPY AT SOLID-LIQUID INTERFACESen_US
dc.typearticleen_US


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