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dc.creatorVan Lear, Goerge A.en_US
dc.creatorLong, Donald R.
dc.date.accessioned2006-06-19T14:30:06Z
dc.date.available2006-06-19T14:30:06Z
dc.date.issued1949en_US
dc.identifier1949-K-2en_US
dc.identifier.urihttp://hdl.handle.net/1811/21735
dc.descriptionAuthor Institution: Lane-Wells Companyen_US
dc.description.abstractPresentations without an abstract printed in the proceedings do not have an abstract (image or text) in the Knowledge Bank record.en_US
dc.language.isoenen_US
dc.publisherOhio State Universityen_US
dc.titleEffect of Slit Widths, Time Constant and Scanning Rate on the Fidelity of a Spectrogramen_US
dc.typearticleen_US


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