dc.creator Scharpen, Leroy H. en_US dc.creator Curl, R. F., Jr. en_US dc.date.accessioned 2006-06-15T16:54:39Z dc.date.available 2006-06-15T16:54:39Z dc.date.issued 1969 en_US dc.identifier 1969-U-13 en_US dc.identifier.uri http://hdl.handle.net/1811/15870 dc.description This work was supported in part by National Science Foundation Grant GP 6305X. en_US dc.description Author Institution: Hewlett-Packard Company Palo Alto; Chemistry Department, Rice University en_US dc.description.abstract A method of calibrating signal strength for the Hewlett-Packard spectrometer by introducing a known modulation index has been devised. The curve of power versus grid voltage for the frequency stabilized backward wave oscillator microwave source is determined. Then a small, known 33.3 kHz square wave voltage is applied to the grid. From the magnitude of this voltage and the power versus grid voltage curve, the modulation index may be calculated and the propertionality constant (overall gain constant) relating signal strength to modulation index determined. The absolute intensities of the lines of several compounds have been measured and compared with theory. Both the maximum peak signal ($\eta$) method and the product of unsaturated absorption coefficient and unsaturated line width ($\gamma_{0} \Delta$) method have been used and will be compared. Application of absolute intensity measurement to quantitative analysis and to determination of thermodynamic quantities will be discussed. en_US dc.format.extent 165230 bytes dc.format.mimetype image/jpeg dc.language.iso English en_US dc.publisher Ohio State University en_US dc.title MEASUREMENT OF ABSOLUTE INTENSITIES IN MICROWAVE ROTATIONAL SPECTROSCOPY en_US dc.type article en_US
﻿