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dc.creatorScharpen, Leroy H.en_US
dc.creatorCurl, R. F., Jr.en_US
dc.date.accessioned2006-06-15T16:54:39Z
dc.date.available2006-06-15T16:54:39Z
dc.date.issued1969en_US
dc.identifier1969-U-13en_US
dc.identifier.urihttp://hdl.handle.net/1811/15870
dc.descriptionThis work was supported in part by National Science Foundation Grant GP 6305X.en_US
dc.descriptionAuthor Institution: Hewlett-Packard Company Palo Alto; Chemistry Department, Rice Universityen_US
dc.description.abstractA method of calibrating signal strength for the Hewlett-Packard spectrometer by introducing a known modulation index has been devised. The curve of power versus grid voltage for the frequency stabilized backward wave oscillator microwave source is determined. Then a small, known 33.3 kHz square wave voltage is applied to the grid. From the magnitude of this voltage and the power versus grid voltage curve, the modulation index may be calculated and the propertionality constant (overall gain constant) relating signal strength to modulation index determined. The absolute intensities of the lines of several compounds have been measured and compared with theory. Both the maximum peak signal ($\eta$) method and the product of unsaturated absorption coefficient and unsaturated line width ($\gamma_{0} \Delta$) method have been used and will be compared. Application of absolute intensity measurement to quantitative analysis and to determination of thermodynamic quantities will be discussed.en_US
dc.format.extent165230 bytes
dc.format.mimetypeimage/jpeg
dc.language.isoEnglishen_US
dc.publisherOhio State Universityen_US
dc.titleMEASUREMENT OF ABSOLUTE INTENSITIES IN MICROWAVE ROTATIONAL SPECTROSCOPYen_US
dc.typearticleen_US


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