dc.creator Brundle, C. R. en_US dc.creator Turner, D. W. en_US dc.date.accessioned 2006-06-15T16:49:20Z dc.date.available 2006-06-15T16:49:20Z dc.date.issued 1969 en_US dc.identifier 1969-B-9 en_US dc.identifier.uri http://hdl.handle.net/1811/15662 dc.description $^{1}$ D. W. Turner, Proc. Roy. Soc. A307, 15 (1968). $^{2}$ C. R. Brundle and D. W. Turner, Proc. Roy. Soc. A307, 27 (1968). $^{3}$ A. D. Baker, C. R., Brundle and D. W. Turner, Inter. J. Mass. Spec. \& Ion Physics 1, 443 (1968). en_US dc.description Author Institution: Bell Telephone Laboratories; Physical Chemistry Laboratory, South Parks Road en_US dc.description.abstract Electrons ejected from gaseous molecules by monochromatic radiation $h\nu$, have energies $E_{i}$, such that $$E_{i}=h\nu-\Delta E_{vib}$$ where $I_{i}$ is the adiabatic ionization potential of the electron removed, and $\Delta E_{vib}$ represents the changes in the vibrational levels of the molecule being ionized. The apparatus used in determining these energies$^{1}$ utilizes a He(I) 584{\AA} (21.22 eV) light source, and a $127^{\circ}$ electrostatic electron velocity analyzer. An energy resolution (half-width at half height) of 0.015 eV for 10 volt electrons is obtainable. Many results obtained have already been $published.^{2,3}$ The spectra of $NH_{3}, SO_{2}$ and $H_{2}S$ all show extensive vibrational fine structure in some or all of the electronic states of the positive ion below 21.22 eV, and ionization potentials accurate to $\pm 0.01$ eV have been measured up to this value. The results are discussed in terms of the electronic structure of the molecules, the bonding characteristics of the various molecular orbitals, and in the light of previously published data concerning the ground and excited ionic states. en_US dc.format.extent 171157 bytes dc.format.mimetype image/jpeg dc.language.iso English en_US dc.publisher Ohio State University en_US dc.title THE HIGH RESOLUTION He I 584{\AA} PHOTOELECTRON SPECTRA OF THE MOLECULES $NH_{3}, SO_{2}$, AND $H_{2}S$. en_US dc.type article en_US
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