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dc.creatorSutton, D. G.en_US
dc.creatorBurak, I.en_US
dc.creatorSteinfeld, J. I.en_US
dc.date.accessioned2006-06-15T16:46:04Z
dc.date.available2006-06-15T16:46:04Z
dc.date.issued1968en_US
dc.identifier1968-O-1en_US
dc.identifier.urihttp://hdl.handle.net/1811/15532
dc.descriptionThis research was supported by the National Science Foundation.en_US
dc.descriptionAuthor Institution: Department of Chemistry, Massachusetts Institute of Technologyen_US
dc.description.abstractHigh power irradiation of $SF_{6}$ by a $CO_{2}$ laser provides enough ground state depletion to be monitored by a conventional infrared absorption spectrometer. The $\nu_{3}$ band $(965 cm^{-1})$ was irradiated; the $\nu_{4} (617 cm^{-1}$ and $\nu_{3}$ bands were monitored. Integrated absorption intensities provide information on ground state populations, which were determined as a function of laser power. The level population information coupled with contour analysis of the monitored bands is interpreted in terms of the vibrational and rotational equilibration processes in $SF_{6}$.en_US
dc.format.extent116702 bytes
dc.format.mimetypeimage/jpeg
dc.language.isoEnglishen_US
dc.publisherOhio State Universityen_US
dc.titleINFRARED-INFRARED DOUBLE RESONANCE SPECTROSCOPY OF SULFUR HEXAFLUORIDE.en_US
dc.typearticleen_US


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