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dc.creatorAdams, Arnolden_US
dc.creatorWest, W. P.en_US
dc.creatorHansma, P. K.en_US
dc.creatorBroida, H. P.en_US
dc.date.accessioned2006-06-15T14:19:02Z
dc.date.available2006-06-15T14:19:02Z
dc.date.issued1979en_US
dc.identifier1979-WD-04en_US
dc.identifier.urihttp://hdl.handle.net/1811/11115
dc.descriptionThis work supported by Air Force Office of Scientific Research.en_US
dc.descriptionAuthor Institution:en_US
dc.description.abstractKnown thicknesses of solid nitrogen (between 2 and 1000 nm) are deposited on substrates cooled to 15K in an ultrahigh vacuum system. The nitrogen it excite by a weak pulse of 3KeV and the $N^{2} D$ $\rightarrow ^{4} S$ lifetime measured. The radiative $N^{2}$D$\rightarrow ^{4} S$ lifetime varies from 37 seconds for very thick nitrogen films to less than 1 seconds for very thin nitrogen films. The radiative lifetime in also substrate dependent. Thin films of solid nitrogen on a sapphire substrate have much longer lifetimes and higher relative quantum efficiencies than do thin nitrogen films on a silver substrate. Thin nitrogen films on thin evaporated silver films over sapphire have even shorter lifetimes and lower quantum efficiencies.en_US
dc.format.extent73403 bytes
dc.format.mimetypeimage/jpeg
dc.language.isoEnglishen_US
dc.publisherOhio State Universityen_US
dc.titleINFLUENCE OF AN INTERFACE ON $N^{2}$D$\rightarrow ^{4} S$ EMISSION IN SOLID $N_{2}$en_US
dc.typearticleen_US


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