# DIODE LASER MEASUREMENTS OF STRENGTHS AND WIDTHS FOR SPECTRAL LINES IN THE $\upsilon_{3}$ AND $\upsilon_{2} + \upsilon_{4}$ BANDS OF $^{12}CH_{4}$ AND $^{13}CH_{4}$

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 Title: DIODE LASER MEASUREMENTS OF STRENGTHS AND WIDTHS FOR SPECTRAL LINES IN THE $\upsilon_{3}$ AND $\upsilon_{2} + \upsilon_{4}$ BANDS OF $^{12}CH_{4}$ AND $^{13}CH_{4}$ Creators: Devi, V. Malathy; Fridovich, B.; Snyder, D. G. S.; Jones, G. D. Issue Date: 1982 Publisher: Ohio State University Abstract: Line strengths, and self- and nitrogen-broadened half-widths have been measured for spectral lines in the $\upsilon_{3}$ and $\upsilon_{2} + \upsilon_{4}$ bands of $^{12}CH_{4}$ and $^{13}CH_{4}$ in the interval $2873-2883 cm^{-1}$. A carbon-13 enriched sample was used for the $^{13}CH_{4}$ measurements. The temperature dependence of the Lorentz broadening coefficient for nitrogen broadening has also been determined for some of the transitions. URI: http://hdl.handle.net/1811/29107 Other Identifiers: 1982-FA-10