# Knowledge Bank

## University Libraries and the Office of the Chief Information Officer

The Knowledge Bank is scheduled for regular maintenance on Sunday, April 20th, 8:00 am to 12:00 pm EDT. During this time users will not be able to register, login, or submit content.

# DIODE LASER MEASUREMENTS OF STRENGTHS AND WIDTHS FOR SPECTRAL LINES IN THE $\upsilon_{3}$ AND $\upsilon_{2} + \upsilon_{4}$ BANDS OF $^{12}CH_{4}$ AND $^{13}CH_{4}$

Please use this identifier to cite or link to this item: http://hdl.handle.net/1811/29107

Files Size Format View
1982-FA-10.jpg 42.21Kb JPEG image

 Title: DIODE LASER MEASUREMENTS OF STRENGTHS AND WIDTHS FOR SPECTRAL LINES IN THE $\upsilon_{3}$ AND $\upsilon_{2} + \upsilon_{4}$ BANDS OF $^{12}CH_{4}$ AND $^{13}CH_{4}$ Creators: Devi, V. Malathy; Fridovich, B.; Snyder, D. G. S.; Jones, G. D. Issue Date: 1982 Abstract: Line strengths, and self- and nitrogen-broadened half-widths have been measured for spectral lines in the $\upsilon_{3}$ and $\upsilon_{2} + \upsilon_{4}$ bands of $^{12}CH_{4}$ and $^{13}CH_{4}$ in the interval $2873-2883 cm^{-1}$. A carbon-13 enriched sample was used for the $^{13}CH_{4}$ measurements. The temperature dependence of the Lorentz broadening coefficient for nitrogen broadening has also been determined for some of the transitions. URI: http://hdl.handle.net/1811/29107 Other Identifiers: 1982-FA-10