VIB-ROTATIONAL ANALYSIS ON $2\nu_{1} + \nu_{5}, \nu_{1} + \nu_{2} + 3\nu_{5}$, and $2\nu_{2} + 5\nu_{5}$ COMBINATION BANDS OF ACETYLENE USING A GaAs SEMICONDUCTOR LASER

Please use this identifier to cite or link to this item: http://hdl.handle.net/1811/18924

Show full item record

Files Size Format View
1998-RF-11.jpg 136.1Kb JPEG image Thumbnail of VIB-ROTATIONAL ANALYSIS ON $2\nu_{1} + \nu_{5}, \nu_{1} + \nu_{2} + 3\nu_{5}$, and $2\nu_{2} + 5\nu_{5}$ COMBINATION BANDS OF ACETYLENE USING A GaAs SEMICONDUCTOR LASER

Title: VIB-ROTATIONAL ANALYSIS ON $2\nu_{1} + \nu_{5}, \nu_{1} + \nu_{2} + 3\nu_{5}$, and $2\nu_{2} + 5\nu_{5}$ COMBINATION BANDS OF ACETYLENE USING A GaAs SEMICONDUCTOR LASER
Creators: Suzuki, M.; Yamashita, T.; Ohtsuka, T.; Yukiya, T.; Nishimiya, N.
Issue Date: 1998
Publisher: Ohio State University
Abstract: The vib-rotational spectrum of the $2\nu_{1}+\nu^{i=1}_{5}, \nu_{1}+\nu_{2}+3\nu_{5}^{i=1}$ and $2\nu_{2}+5\nu_{5}^{i=1}$ combination bands of acetylene was measured using a GaAs semiconductor laser (New Focus 6148) at the wavenumber region from 7400 to $7600 cm^{-1}$ and the P-, R- and Q-branches were assigned. The wavenumber measuring system with a wavelength meter (Anritsu MF9630A) and a confocal interferometer of 15 cm was calibrated against the $H_{2}O lines.^{1}$ The formulation describing the spectral line positions by a third order polynomial of $J(J+1)$ with the effective spectroscopic parameters of $\nu_{0}^{eff},B_{\nu}^{eff}$, and $H_{\nu}^{eff}$ was obtained using second order perturbation theory to take the l-type resonance effect into consideration. The spectroscopic constants and the l-type doubling constants were calculated from the effective rotational parameters determined using a least squares fitting procedure for the e- and f-levels by the aid of the molecular constants reported by ref. 2 and 3.
Description: 1. R.A. Toth, Appl.Opt., 33, 4851 (1994). 2. M. Herman, T.R. Huct, Y. Kabbadj, and J.V. Auwera, Mol.Phys., 72, 75 (1991). 3. J.J. Hillman, D.E. Jennings, G.W. Halsey, S. Nadler, and E.W. Blass, J.Mol.Spectrosc., 146, 3891(1991).
Author Institution: Dept. of Electronic Engineering, Tokyo Institute of Polytechnics
URI: http://hdl.handle.net/1811/18924
Other Identifiers: 1998-RF-11
Bookmark and Share