# DETERMINATION OF THE $^{16}O^{12}C^{32}S \nu_{3}$-FUNDAMENTAL BAND STRENGTH FROM DIODE LASER MEASUREMENTS

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 Title: DETERMINATION OF THE $^{16}O^{12}C^{32}S \nu_{3}$-FUNDAMENTAL BAND STRENGTH FROM DIODE LASER MEASUREMENTS Creators: Blackburn, T. E.; Chackerian, C., Jr.; Loewenstein, M.; Podolske, J. Issue Date: 1986 Publisher: Ohio State University Abstract: The band strength of the $\nu_{3}$-fundamental banc of $^{16}O^{12}C^{32}s$ at $2062 cm^{-1}$ has been determined from measurements made with a tunable diode laser spectrometer. For this analysis of the $v_{3}$ band, individual isolated lines throughout the P and R branches and out to $J = 77$ have been measured. Individual line strengths were determined from fits of the Voigts profiles to the line data. The requiste care has been exercised to assure that the diode laser source radiation is single-mode. From the individual line strengths. the band Herman-Wallis factor, and the total band strength have been determined. Comparison with previous measurements of the $\nu_{3}$-fundamental band strength will be presented. Description: Address of Authors: NASA/AMES RESEARCH CENTER, MS 245-5, Moffett Field, CA 94035 Author Institution: URI: http://hdl.handle.net/1811/17064 Other Identifiers: 1986-TB-3