OSU Navigation Bar

The Ohio State University University Libraries Knowledge Bank

DETERMINATION OF THE $^{16}O^{12}C^{32}S \nu_{3}$-FUNDAMENTAL BAND STRENGTH FROM DIODE LASER MEASUREMENTS

Please use this identifier to cite or link to this item: http://hdl.handle.net/1811/17064

Show full item record

Files Size Format View
1986-TB-03.jpg 149.3Kb JPEG image Thumbnail of DETERMINATION OF THE $^{16}O^{12}C^{32}S \nu_{3}$-FUNDAMENTAL BAND STRENGTH FROM DIODE LASER MEASUREMENTS

Title: DETERMINATION OF THE $^{16}O^{12}C^{32}S \nu_{3}$-FUNDAMENTAL BAND STRENGTH FROM DIODE LASER MEASUREMENTS
Creators: Blackburn, T. E.; Chackerian, C., Jr.; Loewenstein, M.; Podolske, J.
Issue Date: 1986
Abstract: The band strength of the $\nu_{3}$-fundamental banc of $^{16}O^{12}C^{32}s$ at $2062 cm^{-1}$ has been determined from measurements made with a tunable diode laser spectrometer. For this analysis of the $v_{3}$ band, individual isolated lines throughout the P and R branches and out to $J = 77$ have been measured. Individual line strengths were determined from fits of the Voigts profiles to the line data. The requiste care has been exercised to assure that the diode laser source radiation is single-mode. From the individual line strengths. the band Herman-Wallis factor, and the total band strength have been determined. Comparison with previous measurements of the $\nu_{3}$-fundamental band strength will be presented.
URI: http://hdl.handle.net/1811/17064
Other Identifiers: 1986-TB-3
Bookmark and Share