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INFRARED-INFRARED DOUBLE RESONANCE SPECTROSCOPY OF SULFUR HEXAFLUORIDE.

Please use this identifier to cite or link to this item: http://hdl.handle.net/1811/15532

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dc.creator Sutton, D. G. en_US
dc.creator Burak, I. en_US
dc.creator Steinfeld, J. I. en_US
dc.date.accessioned 2006-06-15T16:46:04Z
dc.date.available 2006-06-15T16:46:04Z
dc.date.issued 1968 en_US
dc.identifier 1968-O-1 en_US
dc.identifier.uri http://hdl.handle.net/1811/15532
dc.description This research was supported by the National Science Foundation. en_US
dc.description Author Institution: Department of Chemistry, Massachusetts Institute of Technology en_US
dc.description.abstract High power irradiation of $SF_{6}$ by a $CO_{2}$ laser provides enough ground state depletion to be monitored by a conventional infrared absorption spectrometer. The $\nu_{3}$ band $(965 cm^{-1})$ was irradiated; the $\nu_{4} (617 cm^{-1}$ and $\nu_{3}$ bands were monitored. Integrated absorption intensities provide information on ground state populations, which were determined as a function of laser power. The level population information coupled with contour analysis of the monitored bands is interpreted in terms of the vibrational and rotational equilibration processes in $SF_{6}$. en_US
dc.format.extent 116702 bytes
dc.format.mimetype image/jpeg
dc.language.iso English en_US
dc.title INFRARED-INFRARED DOUBLE RESONANCE SPECTROSCOPY OF SULFUR HEXAFLUORIDE. en_US
dc.type article en_US